Signal Overlapping in EELS
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Electron microscopy
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Signals from different elements can overlap even though the energy resolution of EELS is much higher than that of EDS. For instance, the most common case is that in any multicomponent material the range of EXELFS oscillations is limited by the appearance of another inner-shell edge.

Note that this signal overlapping affects EELS analysis, especially for quantitative analysis (see page4931).

 

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