Comparison between Aberration-Corrected and Uncorrected EMs
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


For electron microscopes without aberration corrections, the higher-order terms in Equation 3740 are overwhelmed by the positive, third-order spherical aberration and thus, we only need to consider the aberration coefficients up to third-order. However, for corrected microscopes the higher-order terms becomes dominant.




The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

Copyright (C) 2006 GlobalSino, All Rights Reserved