Comparison between Aberration-Corrected and Uncorrected EMs
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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For electron microscopes without aberration corrections, the higher-order terms in Equation 3740 are overwhelmed by the positive, third-order spherical aberration and thus, we only need to consider the aberration coefficients up to third-order. However, for corrected microscopes the higher-order terms becomes dominant.

 

 

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