Streaks Formed by Smearing/Blooming in CCD Camera
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

 

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The electrons generated by photons during the exposure time are collected in the wells in the sensors of CCD camera. The maximum number of electrons that a pixel can hold is determined by the full-well capacity and plays a dominant role in characterizing the CCD’s dynamic range. If the number of generated charges exceeds full-well capacity of a pixel during the exposure time, the extra charges will flow to the neighbor cells, meaning if these wells are saturated the extra charges will flow to the adjacent pixels. This process is called smearing or blooming, which induces fully saturated streaks on the image, destroying pixel information. For instance, Figure 3964 shows streaking artifacts presented in an TEM electron diffraction pattern recorded by a CCD camera.

Streaking artifacts presented in an TEM electron diffraction pattern recorded by a CCD camera

Figure 3964. Streaking artifacts presented in an TEM electron diffraction pattern recorded by a CCD camera.

 

 

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