Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

TEM Imaging of CrSix

Table 966. Electron diffraction of chromium silicides.

Chromium
silicides
TEM images
CrSi2


structure of CrSi2 C54 type
The structure of CrSi2 C40 type is based on close packed MeSi2-layer sequences of ABC. The B and C positions are the saddle point positions of the metal atoms of the next layer in alphabetical order.