Chapter/Index: Introduction | A |
B |
C |
D |
E |
F |
G |
H |
I |
J |
K |
L |
M |
N |
O |
P |
Q |
R |
S |
T |
U |
V |
W |
X |
Y |
Z |
Appendix
BIST (Built-In Self-Test)
| Built-In Self-Test (BIST) is a design-for-test (DFT) technique where test circuitry is integrated directly into the chip itself. Instead of relying only on external test equipment to apply test patterns and capture responses, the chip can partially “test itself”:
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Test Pattern Generation: A built-in module (often using a Linear Feedback Shift Register, LFSR) automatically generates pseudo-random or deterministic test patterns.
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Response Analysis: Another module (often a Multiple-Input Signature Register, MISR) compresses the circuit’s responses into a compact “signature.”
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Comparison: The on-chip system compares this signature against a “golden signature.” If they match, the chip is assumed to be fault-free; if not, a defect is present.
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