Example of High Resolution TEM images

High-resolution cross-section in <110> direction from the TiN/Si(100) system, showing domain matching of TiN with silicon. Here the frequency factor (α ± = 0.5) for 4/3 and 4/5 domains. The a/2<110> misfit dislocations lie in {111} planes in both TiN and silicon; the
inset shows a corresponding <110> TiN/Si diffraction pattern.

Contact us: Feedback