EDS Measurement of Lanthanum
- Practical Electron Microscopy and Database -
- An Online Book -
Electron microscopy
  Microanalysis | EM Book                                                                   http://www.globalsino.com/EM/  


The La EDS map can be extracted from the La lines at 2.84 kV using an empirical Kramers background fitting followed by multiple linear least square (MLLS) fitting of each peak family represented by a set of Gaussian peaks.