Reduction of EDS Background
- Practical Electron Microscopy and Database -
- An Online Book -
Electron microscopy
  Microanalysis | EM Book                                                                   http://www.globalsino.com/EM/  
 

 

The TEM specimen holders used for EDS analysis are normally made from a material with a low atomic number such as beryllium (Be) or carbon (C) in order to reduce X-ray background (see page2521).

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