EDS-TEM Specimen Holders
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The TEM specimen holders used for EDS analysis are normally made from a material with a low atomic number such as beryllium (Be) or carbon (C) in order to reduce/minimize the following effects from the specimen holder:
        i) The number of backscattered electrons.
        ii) The effect of spurious characteristic x-ray peaks.
        iii) The hard X-ray background (high-energy Bremsstrahlung X-rays generated by electron irradiation).

It is important to mention that Be is poisonous, so that touching a beryllium tip with the fingers is not allowed.

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.