Electron microscopy
 
Interface Analysis by TEM/STEM
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

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In TEM and high-voltage STEM, one of the big advantage that high resolution and sensitivity can provide us is the ability to analyze the interfaces and defects in more detail and the distribution of point defects (vacancies and impurities) around these structures. However, point defects are mobile, and thus the defect and interface structures are less stable than the bulk material.

 

 

 

 

 

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