Electron microscopy
 
Artifacts and Drawbacks of XRD Technique
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Single-crystal XRD is normally more sensitive to weak reflections than powders. However, conformation is still needed when we conclude a weak forbidden reflection, because λ/2 contamination of the X-ray source and multiple diffraction effect are usually unavoidable, e.g. for inorganic single crystals.

The overlapping problem of powder X-ray diffraction (PXRD) can be partially solved through the fast iterative Patterson squaring (FIPS), [1] repartitioning by histogram matching in a charge-flipping algorithm [2] or other methods.

 

 

 

 

[1] M. A. Estermann, L. B. McCusker and Ch. Baerlocher, J. Appl. Crystallogr., 1992, 25, 539; M. A. Estermann and V. Gramlich, J. Appl.
Crystallogr., 1993, 26, 396.
[2] Ch. Baerlocher, L. B.McCusker and L. Palatinus, Z. Kristallogr., 2007, 20 222, 47.

 

 

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