Phase Shift of Incident Electrons Induced by TEM Specimen
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The phase shift of the TEM electron beam after penetrating through the specimen depends on the local mass thickness and local variations in density caused by defects, resulting in variations in electron intensity.

 

 

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