
Beam Convergence Angle/Coherence Effects on CTF Patterns
 Practical Electron Microscopy and Database 
 An Online Book 

http://www.globalsino.com/EM/ 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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By changing the angle of illumination upon the TEM sample, the coherence of the electron beam can be varied. Figure 1709 shows the ratio of Fourier spectra taken from two calculated CTFs at different beam convergences (0.38 and 0.36 mrad). This figure indicates the nonconstant effect of coherence (beam convergence angle) on CTF.
Figure 1709. The ratio of Fourier spectra taken from two calculated CTFs at different beam convergences. Adapted from [1]
[1] Peter D. Miller and J. Murray Gibson, Connecting smallangle diffraction with realspace images by quantitative transmission electron microscopy of amorphous thinÞlms, Ultramicroscopy 74 (1998) 221235.

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