This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The short-range properties of materials, e.g. of amorphous materials, can be characterized by a variety of techniques such as vibrational spectroscopies, magnetic resonance, inelastic scattering, and diffraction. The analysis needs to differentiate between the natural amorphous randomness and the defective structure.