Spatial Resolution of Inelastic Signals
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Inelastic scattering of incident electrons occurring in materials is physically delocalized within a certain lateral distance. This phenomenon fundamentally induces a physical limit on the spatial resolution of the inelastic signal, even though the signal is recorded with an ideal instrument.




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