|
|
Spatial Resolution of Inelastic Signals
- Practical Electron Microscopy and Database -
- An Online Book -
|
|
https://www.globalsino.com/EM/
|
|
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
|
=================================================================================
Inelastic scattering of incident electrons occurring in materials is physically delocalized within a certain lateral distance. This phenomenon fundamentally induces a physical limit on the spatial resolution of the inelastic signal, even though the signal is recorded with an ideal instrument.
|
=================================================================================
The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
|
|
