Electron microscopy
Comparisons between HRTEM and EELS Techniques
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


In many cases, HRTEM does not observe an amorphous layer at grain boundaries in polycrystalline materials; however, EELS can still detect impurities and/or different bonds at such boundaries than grain bodies.



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