Electron microscopy
 
Comparisons between HRTEM and EELS Techniques
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
=================================================================================

 

In many cases, HRTEM does not observe an amorphous layer at grain boundaries in polycrystalline materials; however, EELS can still detect impurities and/or different bonds at such boundaries than grain bodies.

 

 

=================================================================================
The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.