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Correction of Astigmatism of Objective
Lens in TEM based on Diffractogram
- Practical Electron Microscopy and Database -
- An Online Book -
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http://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The astigmatism of objective lens in TEM can be corrected based on diffractogram at high magnifications [1]. This method requires an amorphous phase of a thin region in a sample.
[1] D.B.Williams,C.B.Carter,TransmissionElectronMicroscopy,PlenumPress,
NewYork,1996.
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