Preferential Ion Milling at Grain Boundaries
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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For TEM specimens prepared by ion milling, the local specimen thickness at the grain boundaries is normally smaller than that in the grain body due to preferential ion milling at the grain boundaries.

 

 

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