This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Defocus CBED using high-index reflections provides a more accurate determination method of displacement vectors (R) of stacking faults than two-beam method with exciting low-index reflections, selected area electron diffraction method with low index reflections, and HRTEM technique. [1]

[1] Susumu Yamada and Michiyoshi Tanaka, Structure of a stacking fault in the (-101) plane of TiO2, Journal of Electron Microscopy 1: 67-74 (1997).