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Dislocation Density
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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An example is that the dislocation densities in the GaN crystals and thin-films are in the order of 1010 cm-3, propagating in the growth direction and cross the active region of the high efficiency light emitting diodes.[1]
[1] F. A. Ponce, J. S. Major, Jr., W. E. Plano, and D. F. Welch, Appl. Phys.
Lett. 65, 2303 (1994).
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Yougui Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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