This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Investigating individual point defects, e.g. monovacancies, using TEM-related techniques was believed to be difficult because this requires both atomic sensitivity and atomic resolution and the specimens need to be very thin such that one can detect the individual point defects from the image contrast.