EBSD Measurements
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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EBSD patterns consist of complex arrays of Kikuchi lines and networks of projected zone axes. In order to be able to use these patterns for crystallographic analysis, a set of quantitative and qualitative parameters are needed. These parameters are mainly the equivalent electron source point on the pattern, or pattern centre, specimen-to-detector distance, interzonal angles, Bragg angles, interplanar angles, and interplanar spacing.

 

 

 

 

 

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The book author (Dr Y. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr Y. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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