Theoretical Interpretation of STEM/TEM Images about Crystalline Defects
- Practical Electron Microscopy and Database -
- An Online Book -

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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In STEM analysis, the effect of the beam–specimen interaction in modifying the probe wave function into the sample exit wave function can be modeled using either the Bloch wave approach [1,2] or a multislice approach. [3,4] In the Bloch waves approach, [1,2] one employs the fact that the eigenfunctions of electrons inside a crystalline solid are in the form of Bloch waves. Therefore, the modeling of the beam–sample interaction is converted into a problem of wave function matching at the entrance surface and at the exit surface. Such an approach is very useful for the interpretation of the HAADF-STEM images taken from perfect periodic structures, but is not applicable to accurately predict the HAADF-STEM images of real specimens because it cannot be easily applied to defects or surfaces.

 

 

 

[1] Nellist P, Pennycook SJ. Ultramicroscopy 1999;78:111–24.
[2] Peng Y, Nellist PD, Pennycook SJ. J Electron Microsc 2004;53:257–66.
[3] Kirkland EJ, Loane RF, Silcox J. Ultramicroscopy 1987;23:77–96.
[4] Cowley JM, Moodie AF. Acta Crystallogr 1957;10:609–19.

 

 

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