Practical Electron Microscopy and Database

An Online Book, Second Edition by Dr. Yougui Liao (2006)

Practical Electron Microscopy and Database - An Online Book

Chapter/Index: Introduction | A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z | Appendix

Sensitivity of STEM Contrast to Focus

Based on the optical reciprocity theorem [1], BF-STEM images can be related to the HRTEM images of an atom as a phase object. Like HRTEM images, BF-STEM images are very sensitive to the focal conditions, and contrast reversal is often observed because of multiple scattering and phase shift due to defocus condition of the lens. A full interpretation of BF-STEM images can be done with phase contrast simulation in the same way as the HRTEM images. [2]

 

 

 


 
 
[1] Born M, Wolf E. Principles of optics. Cambridge, UK: Cambridge University Press; 1997. 
[2] Spence JCH. High resolution electron microscopy. 3rd ed. Oxford: Clarendon Press; 2003.