This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

For tilt tomography in TEM and STEM, the resolution of a reconstructed tomogram is determined by the number of images in the tilt series and by the tilt range. In other words, the resolution is equal to the angular increment of the tilt series multiplied by the size of the object [1]. However, in practice, to limit beam damage and to minimize acquisition times, the images are recorded every 1–2°.

[1] Crowther, R. A., de Rosier, D. J. and Klug, A. The reconstruction of a three-dimensional structure from projections and its application to electron microscopy. Proc. R. Soc. Lond. A 319, 317–340 (1970).