This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Indexing CBED ZOLZ patterns is similar to indexing SAD (selected area diffraction) patterns. With the indexed CBED patterns one can do exactly the same type of orientation determination as with the indexed SAD patterns. However, CBED can work on a much smaller dimensional scale, e.g. suitable for crystallographic analysis of nanostructures.

For indexing CBED patterns, it’s easiest to index ZAPs so that the TEM specimen should be tilted around under Kossel conditions until we find a ZAP where Kikuchi bands intersect, then a C2 aperture size is selected to form diffraction disks (K-M conditions) in the HOLZ ring.