
Electron Atomic Scattering Factors
 Practical Electron Microscopy and Database 
 An Online Book 

http://www.globalsino.com/EM/

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.

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The temperature factors for electron atomic scattering are much less important than for Xrays because the electron atomic scattering factors fall off with [sin(Θ/λ)]^{2}, which is much more rapidly than their corresponding scatterings for Xrays. Here, Θ is the half of the angle between the transmitted and scattered electron beams, and λ is the wavelength of the incident electron beam.

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.

