This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

The atomic scattering factors for high-energy electrons are approximately three orders of magnitudes larger than for X-rays. This ensures that there will be sufficient diffracted intensity in electron diffraction patterns so that structural information can be obtained for fingerprinting purposes in the TEM even for the smallest nanocrystals. However, this strong scattering of electrons by matter may complicate the analysis due to dynamical diffraction effects.