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Off-axis Aberrations in EMs
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The off-axis aberrations are negligible in the case of high-resolution TEM imaging and STEM [1].
[1] S. Uhlemann, M. Haider, Ultramicroscopy 72 (1998) 109.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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