Electron Spot/Beam Size and Shape Limited by Diffraction
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

Because of the dependence of beam size on diffraction and aberrations as shown in Figure 2752, in order to achieve the optimum performance the diffraction and aberrations should be balanced as indicated by the optimum convergence semi-angles. For big electron sources, at low convergence semi-angles (α), the diffraction mainly determines the beam size, while at high α the spherical aberration is the dominant factor.
The diffraction term is given by,
        dd=0.61λ/α ----------------- [2752a]
The spherical aberration term is given by,
        ds=1/2Csα3 -------------------------- [2752b]
where,
        λ --  The wavelength of the incident electron beam,
        Cs -- The spherical aberration coefficient,
        α -- The convergence semi-angle.

electron beam diameter and aberrations

Figure 2752. Diameter of the electron-beam as a function of beam-convergence semi-angle. 1: big electron source. 2: small electron source.

 

 

=================================================================================

The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.