This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The inelastical phonon excitation of incident electrons, also known as thermal diffuse scattering (TDS), normally is not considered in CTEM (conventional transmission electron microscopy) simulations, e.g. in quantitative analysis of HRTEM (high-resolution transmission electron microscopy). The ubiquitous, large contrast mismatch (in the range of 2 to 4 times) between the experimental images and theoretical simulations is known as Stobbs factor [1].