Qualitative Interpretation of EELS Spectra
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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For EELS quantification we normally need to choose K or L edges.

Extracting quantitative information from EEL spectra is usually a complicated procedure that requires many work steps like spectrum deconvolution, separation of overlapping core-loss edges, edge background removal and calculation of the edge net area.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.



 
 
 
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