Visual Inspection for Destructive and/or
Nondestructive Analysis of IC Devices
- Practical Electron Microscopy and Database -
- An Online Book -

https://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Figure 2921 shows the visual inspection flow of destructive and/or nondestructive analysis of IC devices.

Visual inspection flow for destructive and/or nondestructive analysis of IC devices

Figure 2921. Visual inspection flow of destructive and/or nondestructive analysis of IC devices.

 

 

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