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STEM Imaging Affected by Accelerating Voltage of Electron Beam
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The extent of electron backscattering increases at low accelerating voltages of the incident electron beam, therefore, it reduces the contrast of STEM images. However, the STEM contrast would not be affect too much if the specimen is very thin.
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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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