Electron microscopy
 
Speed Considerations in EM Analyses
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Electron microscopy (EM) and its relevant techniques have more and more applications recently. Especially, in industry, pressure has been put on the speed of this type of analysis mainly because of the reasons below:
        i) Application to quality assurance or grading.
        ii) To obtain better profits by adding more control mechanisms in products.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.