Electron microscopy
 
Angular Distribution of Dignal/Information from TEM Measurement
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Figure 3164 shows angular distributions of various scattered electrons as a function of scattering angle in EMs.

Elastic scattering of electrons with crystalline and amorphous specimens
Phonon scattering
(a)
(b)
Inner-shell ionization losses
Plasmon losses
(c)
(d)

Figure 3164. (a) Elastic scattering of electrons with crystalline and amorphous specimens, (b) Phonon scattering, (c) Inner-shell ionization losses, and (d) Plasmon losses.

 

 

 

 

 

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