Electron microscopy
 
Electron Beam Flooding/Beam Shower to Eliminate Contamination Effects in EMs
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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The negative effects of specimen contamination in EM analyses (especially TEM analysis) can be reduced or even eliminated by so-called electron beam flooding or beam shower. In TEM, the flooding is normally done at low magnification with a large electron flux. In this way, the contaminants (mainly hydrocarbons) on the TEM specimen can be polymerized in the form of a uniform fixed layer or can be cracked, and thus the contaminants will neither move to nor accumulate in the electron-analyzing area.

 

 

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.