Electron microscopy
Dependence of Observable Thickness on Accelerating Voltage in TEM
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


Because of the limit of specimen penetration, the effectively observable thickness increases ~3 to 10 times with voltage increase from 100 keV to 1 MeV in TEM.



The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.