Electron microscopy
 
EDS Signal Affected by Secondary and Backscattered Electrons
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   http://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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When a windowless detector is used in a TEM with an accelerating voltage ≥ 200 keV, the detector can be damaged by backscattered electrons from the TEM specimen.

 

 

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