Electron microscopy
 
TEM/STEM Holders for In-Situ Electrical Biasing
- Practical Electron Microscopy and Database -
- An Online Book -
Microanalysis | EM Book                                                                                   https://www.globalsino.com/EM/        

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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TEM/STEM holders for in-situ electrical biasing are mainly applied to observe the effect of electric field on material properties and to measure the properties of emission and conductivity.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.