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Mapping of CoSi and CoSi2 Distributions
- Practical Electron Microscopy and Database -
- An Online Book -
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https://www.globalsino.com/EM/
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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Differentiation between CoSi and CoSi2 can be performed using Si L2,3 ELNES (electron energy-loss near edge structure) mapping but not EELS elemental mapping.
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The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.
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