EELS Measurements of Hydrogen (H)
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Different from EDS, EELS can provide elemental data on all the light elements except H and He, although the latter had been detected under certain conditions, e.g., in nanometer-sized He bubbles in irradiated Ni alloys [1].

It should be mentioned that EELS can probably detect the molecules containing H element. Brown and Ho [2] used an EELS spectrometer with an incident electron energy of 10 eV, consisting of a double-pass cylindrical monochromator and single-pass cylindrical analyzer, to analyze the interaction between methyl chloride and Si( 100) 2 x 1. Figure 3403 shows the EEL spectra obtained after 1 L exposures of methyl chloride (CH3CI) onto the Si(100) surface held at 85 and 300 K. The origin of the peaks, related to the existence of molecularly adsorbed species, is listed in Table 3403.

EEL spectra obtained after 1 L exposures of methyl chloride onto the Si(100) surface held at 85 and 300 K

Figure 3403. The EEL spectra obtained after 1 L exposures of methyl chloride onto the Si(100) surface held at 85 and 300 K. [2]

Table 3403. The origin of the peaks in Figure 3403.
Energy loss Origin
67 meV The Si-Cl stretch: an adsorbed chlorine atom
89 meV The C-Cl stretch of a weakly bound methyl chloride molecule
85 meV The Si-(CH3) stretch
157 meV The CH3 symmetric deformation mode
178 meV The CH3 asymmetric deformation mode
368 meV The C-H stretch modes

 

 

 

 

 

 

 

 

 


 


 

 

 

 


 

 

 

 

[1] McGibbon, A.J. (1991) The application of PEELS on a STEM to the problem ofinert gas bubbles in solids. In F.J Humphreys, Ed., Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, p. 109-1 12. Institute of Physics Conference Series no 1 19, Institute of Physics, Bristol.
[2] Kyle A. Brown and W. Ho, The interaction of methyl chloride and Si( 100) 2 x 1, Surface Science 338 (1995) 111-116.

 

 

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