Optical Condition for High-magnification Imaging in TEM
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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High-magnification CTEM imaging requires the first projector (P1) to run near its maximum strength, and the objective lens (OL) to project a focused image of the specimen into the front-focal plane of P1.

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.