Effects of Axial Illumination Conditions in TEM System
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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Under axial illumination conditions it is not possible to measure all aberration coefficients. In this case, only the defocus and the twofold astigmatism can be determined by the defocus-based techniques.

 

 

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