EM Image Simulations at High Spatial Resolutions
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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EM image simulations can be employed to compare experimental images with model structures even at spatial frequencies above the point to point resolution, but this requires one to have an accurate idea and model about the sample structure from the beginning. [1]

 

 

[1] J. C. H. Spence, “The future of atomic resolution electron microscopy for materials science,” Mater. Sci. Eng., vol. R26, pp. 1 – 49, 1999.

 

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