Model for TEM Samples
- Practical Electron Microscopy and Database -
- An Online Book -  

This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.


The TEM sample is usually described by a projected potential model where the atomic potentials will modify the phase (and only the phase) of the wave of the incident electrons as the electrons passes through the material, which is represented by the phase object approximation (POA). When the specimen is thin and thus the phase change is small, this model can be further simplified by the weak phase object approximation (WPOA), which is a linear approximation.




The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.

Copyright (C) 2006 GlobalSino, All Rights Reserved