Electrons Emitted at Low & High Angles from Electron Guns
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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In EMs, the condenser aperture is used to exclude electrons emitted at high angles from the electron gun, which will decrease the brightness but improve the quality of the illumination because these peripheral electrons are less coherent, especially in LaB6 and W (tungsten) guns.

 

 

 

 

 

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The book author (Yougui Liao) welcomes your comments, suggestions, and corrections, please click here for submission. If you let book author know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page.