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This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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Similar to other methods such as focal series restoration and holography [1 - 3], tilt azimuth restorations [4 - 7] has also the advantage of offering both the phase and modulus of the specimen exit plane wave function, free from artifacts, rather than the aberrated image intensity existing in the conventional image.
[1] H. Lichte, in: Advances in Optical and Electron Microscopy,
Vol. 12, Academic Press, New York, 1991, pp. 25–91.
[2] A. Orchowski, W.D. Rau, H. Lichte, Phys. Rev. Lett. 74
(1995) 399–402.
[3] M. Lehmann, H. Lichte, D. Geiger, G. Lang, E. Schweda,
Mater. Characterization 42 (4–5) (1999) 249–263.
[4] A.I. Kirkland, W.O. Saxton, K.L. Chau, K. Tsuno, M.
Kawasaki, Ultramicroscopy 57 (4) (1995) 355–374.
[5] A.I. Kirkland, W.O. Saxton, G. Chand, J. Electron
Microsc. 1 (1997) 11–22.
[6] M. Op de Beeck, D. van Dyck, W. Coene, Ultramicroscopy
64 (1–4) (1996) 167–183.
[7] W.O. Saxton, J. Microsc. 179 (1995) 201–214.
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