Sample Thickness Dependence of TEM Image Intensity/Contrast
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

=================================================================================

In TEM observations, the non-linear components of the image intensity increase with specimen thickness.

High voltage TEM (transmission electron microscopy) has several advantages. The most important advantages are: i) The observation of internal structures in thick specimens at good image intensities and ii) The high spatial resolution.

The TEM contrast decreases as the specimen thickness increases. For instance, the 1-nm He (helium) bubble in palladium tritides becomes hardly detectable when the thickness reaches 12 nm. [1] Moreover, the contrast is also affected by the position of the bubble in the specimen thickness. It increases when the bubble locates close to the lower surface of the specimen.

 

 

 

 

[1] S. Thiébaut, B. Décamps, J. M. Pénisson, B. Limacher, A. Percheron Guégan, TEM study of the aging of palladium-based alloys during tritium storage, Journal of Nuclear Materials 277 (2000) 217-225.

 

 

 

 

=================================================================================

The book author (Dr. Liao) welcomes your comments, suggestions, and corrections, please click here for submission. You can click How to Cite This Book to cite this book. If you let Dr. Liao know once you have cited this book, the brief information of your publication will appear on the “Times Cited” page. This appearance can help advertise your publication.



 
 
 
Copyright (C) 2006 GlobalSino, All Rights Reserved