Slow Scan Charge-coupled Device (SSCCD)
Camera for Cs Determinations
- Practical Electron Microscopy and Database -
- An Online Book -

http://www.globalsino.com/EM/  



 
This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
 

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The spherical aberration coefficient of EMs can be determined by Krivanek model [1], statistic method [2], and electron-beam-tilt technique [3]. An efficient way for processing the Cs determinations has recently been performed by slow scan charge-coupled device (SSCCD) camera system.

 

 

 

 


[1] Krivanek, O. L., A method for determing the coefficient of spherical aberration from a single electron micrograph, Optik, 1976, 45(1): 97.
[2] Coene, W. M. J., Deneteneer, T. J. J., Improved methods for the determination of the spherical aberration coefficient in high-resolution electron microscopy from micrographs of an amorphous object, Ultramicroscopy, 1991, 38, 225.
[3] Koster, A. J., de Jong, A. J., Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacements, Ultramicroscopy, 1991, 38, 235

 

 

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